ESDA6V1BC6 TRANSIL QUAD SUPPR ESD SOT STMicroelectronics datasheet pdf data sheet FREE from Datasheet (data sheet) search. ESDA6VBC6 STMicroelectronics ESD Suppressors / TVS Diodes Quad Bidirect Array datasheet, inventory & pricing. ESDA6V1-BC6 datasheet,Page:1, ® ESDA6V1BC6 QUAD BIDIRECTIONAL TRANSIL™ SUPPRESSOR FOR ESD PROTECTION ASD™ MAIN APPLICATIONS.

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Application Specific Discretes A. Peak power dissipation versus esca6v1 junction temperature. Capacitance versus reverse applied voltage typical values. Relative variation of leakage current versus junction temperature typical values.

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Peak forward voltage drop versus peak forward current typical values. ESD protection is achieved by clamping the unwanted overvoltage. The clamping voltage is given by the following formula: By taking into account the following hypothesis: It is also important to note that in this approximation the parasitic inductance effect was not taken into account. A3 the high efficiency of the ESD protection: A3a and -Vf negative way, Fig.


Remaining voltage during ESD surge a: For these kind of disturbances it clamps close to ground voltage as shown in Fig.

This part of the VG1 signal represents the effect of the crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works with low voltage signal or high eesda6v1 impedance few k?

Analog crosstalk measurements 50? Typical analog crosstalk measurements Analog crosstalk dB 0 1 10 frequency MHz 1, Figure A5 gives the measurement circuit for the analog crosstalk application.

In usual frequency range of analog signals up to MHz the effect on disturbed ezda6v1 is less than dB. Digital crosstalk measurements configuration Figure A7 shows the measurement circuit used to quantify the crosstalk effect in a classical digital application.


PJEC3V3M1FN2 – Bidirectional ESD protection of one line

Figure A8 shows that in such a condition, i. No data disturbance was noted on the concerned line. The measurements performed with falling edges give an impact within the same range. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use.


No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.

STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.